Features:
- Ultimate spatial resolution for SEM-EDS
- Down to 1kV materials characterisation
- Fastest and most accurate nano-characterisation
- Extreme light element sensitivity
Solutions for Biological Samples
Ultim Extreme provides definitive elemental detection for biological samples, enabling fast, accurate data collection in low kV conditions suited to life science SEM applications.
100nm section of unstained leaf tissue on aluminum stub, imaged using 2.5kV for 15 minutes.
Solutions for Materials Science – Ultimate spatial resolution for SEM-EDS
- Sub 10nm element characterization in the SEM
- X-ray map resolution close to SEM resolution
Example 1: Semiconductor Device
X-Ray map of smartphone CPU acquired at 3kV, 38,000CPS for 30mins – sample and data courtesy of MSSCorps.
Example 2: Sn imaging standard
X-ray mapping at 2kV of tin nano-sphere high resolution imaging standard, 6,500CPS, 15min acquisition time.
Example 3: Ni-base Superalloy
Fine Ni3(NbTi) gamma” precipitates in Alloy 718, collected at 1.5 kV, 2,000cps for 18 minutes – Sample and data courtesy of University of Manchester.
