Features:
- Guaranteed indexing speeds > 4500 patterns per second (pps)
- Fibre-optic lens delivering unrivalled sensitivity
- Highest sensitivity > 800 pps / nA
- 156 x 88 pixel resolution at maximum speed
- Full megapixel resolution (1244 x 1024) patterns
Ideal for high angular resolution (HR)-EBSD strain analyses - Sub-pixel distortion
Ensuring an angular precision below 0.05° - Software controlled tilting interface coupled with autocalibration
Perfect positioning and indexing for all sample sizes and geometries - Unique proximity sensor
Detects potential collisions before they happen and automatically moves the detector to a safe position - Five integrated forescatter detectors (optional)
Providing full colour complementary channelling contrast and atomic number contrast images - Bellows SEM interface
Maintaining the microscope’s vacuum integrity - Simple and intuitive detector settings
Ensuring optimum results every time
Applications
- Routine analysis of standard metal and alloy samples
- In-depth examination of strain and deformation
- Effective characterization of complex or beam sensitive samples
- Optimised measurement of large samples
- Transmission Kikuchi Diffraction (TKD) analysis of nanocrystalline materials
Rapid quality control of materials properties
High speed analysis of beam-sensitive samples
Detailed analysis of strained samples
Analysis of any sample size
