The HITACHI SU5000 Schottky FE-SEM is a state-of-the-art scanning electron microscope designed to deliver exceptional imaging performance. With its innovative EM Wizard interface, this microscope ensures optimal resolution, repeatability, and throughput, making it easy for beginners to achieve expert-level results overnight.
Features of Hitachi SU5000 Schottky FE-SEM:
EM Wizard Interface:
- The revolutionary EM Wizard interface provides users with the best imaging conditions, transforming beginners into experts. This knowledge-based system goes beyond basic pre-set conditions and recipes, offering advanced SEM imaging capabilities.
Automatic Axis Adjustment:
- The automatic axis adjustment technology (auto-calibration) restores the microscope to its optimal condition on demand. This feature ensures that the microscope is always in its best condition, providing consistent and reliable results.
Robust Specimen Chamber:
- The SU5000 features a robust “draw-out” specimen chamber that accommodates large specimens up to 200 mm in diameter and 80 mm in height. This allows for the examination of a wide range of sample sizes and types.
Rapid Sample Exchange:
- With the ability to evacuate to observation in 3 minutes or less, the SU5000 offers rapid sample exchange. This feature enhances productivity and reduces downtime, making it ideal for high-throughput environments.
On-Demand Image Optimization:
- The automated, intuitive on-demand image optimization feature ensures that users can achieve the best possible images with minimal effort. This feature simplifies the imaging process and enhances the overall user experience.
Interactive SEM Modes:
- A visual and interactive guide offers ‘pick and choose’ SEM modes to ensure the best operating conditions. This feature allows users to easily select the appropriate mode for their specific imaging needs.
3D MultiFinder Tool:
- The 3D MultiFinder tool enables easy tilting and rotation of samples while keeping the image centered and in focus. This feature provides greater flexibility and precision in sample examination
Experience the future of SEM imaging with the HITACHI SU5000 Schottky FE-SEM. With its advanced technology and user-friendly design, this microscope offers unparalleled performance and versatility. Whether you are conducting research, quality control, or educational activities, the SU5000 is the perfect tool to meet your imaging needs.
Application
Specimen: Multi-Walled Carbon Nanotube Outer Structure
Acquired at 500 V of landing energy, Mag=200kX.
