Experience the HITACHI SU3800/SU3900 SEM, a state-of-the-art scanning electron microscope designed to deliver exceptional imaging and analysis capabilities. With its advanced features and user-friendly interface, the SU3800/SU3900 SEM is ideal for a wide range of applications, from materials science to industrial inspection. This versatile and reliable SEM ensures precise and high-quality results, making it an invaluable tool for researchers and professionals alike.
Features of HITACHI SU3800/SU3900 SEM:
Larger specimen chamber
- Robust stage for flexibility in sample size, shape & weight
- Specimen protection by its exchange sequence
- Increased viewing area with SEM MAP expanding sample navigation boundary
Improved automatic functions
- Multiple operation modes for easy operation & flexibility
- Automatic functions for various users via AFS, ABCC, AFC, ASC, IFT, Auto Focus
- Optional Multi Zigzag enables wide area observation across multiple areas
Integrated solutions and detectors for various applications
- High sensitivity detectors supporting all observation requirements, up to 20 ports
- Optional SEM/EDS integration system, to allow full control by SEM graphic user interface
- High sensitivity detectors, includes segmented BSED for composition & topography observation, optional UVD for CL observation, optional STEM holder for transmission image of thin samples
- Optional software, includes Hitachi Map 3D and Image-Pro® for image processing, measurement, analysis, modelling
The Hitachi SU3800/SU3900 SEMt stands out as a premier choice for those seeking high-performance imaging and analysis capabilities. Its combination of advanced features, user-friendly design, and robust construction ensures that it meets the diverse needs of researchers and professionals. Whether you are conducting detailed material analysis, quality control, or educational usage, the SU3800/SU3900 SEM provides the performance and versatility needed to excel in your work.
Application
Sample : CNT
Accelerating voltage : 30 kV
Image signal : STEM
Magnification : 30,000x
