Experience the HITACHI SU3800 SEM Demo Unit, a state-of-the-art scanning electron microscope designed to deliver exceptional imaging and analysis capabilities. With its advanced features and user-friendly interface, the SU3800 SEM is ideal for a wide range of applications, from materials science to industrial inspection. This versatile and reliable SEM ensures precise and high-quality results, making it an invaluable tool for researchers and professionals alike.
Features of HITACHI SU3800 SEM Demo Unit:
- Larger specimen chamber
– Robust stage for flexibility in sample size, shape & weight
– Specimen protection by its exchange sequence
– Increased viewing area with SEM MAP expanding sample navigation boundary - Improved automatic functions
– Multiple operation modes for easy operation & flexibility
– Automatic functions for various users via AFS, ABCC, AFC, ASC, IFT, Auto Focus
– Optional Multi Zigzag enables wide area observation across multiple areas - Integrated solutions and detectors for various applications
– High sensitivity detectors supporting all observation requirements, up to 20 ports
– Optional SEM/EDS integration system, to allow full control by SEM graphic user interface
– High sensitivity detectors, includes segmented BSED for composition & topography observation, optional UVD for CL observation, optional STEM holder for transmission image of thin samples
– Optional software, includes Hitachi Map 3D and Image-Pro® for image processing, measurement, analysis, modelling
The Hitachi SU3800 SEM Demo Unit stands out as a premier choice for those seeking high-performance imaging and analysis capabilities. Its combination of advanced features, user-friendly design, and robust construction ensures that it meets the diverse needs of researchers and professionals. Whether you are conducting detailed material analysis, quality control, or educational demonstrations, the SU3800 SEM provides the performance and versatility needed to excel in your work.
Application
Sample : CNT
Accelerating voltage : 30 kV
Image signal : STEM
Magnification : 30,000x
