The Hitachi Regulus Series Ultrahigh-Resolution Field-Emission Scanning Electron Microscopes (FE-SEM) offer advanced functionality and improved resolution, making them ideal for a wide range of applications. The definitive instruments for extreme surface observation, equipped with diverse signal detection systems. Supports a wide range of applications, including observation of surface profile, compositional images, ultra-low acceleration images, and VC images.
Features of Hitachi Regulus Series Ultrahigh-Resolution FE-SEM
Optimized Cold Field Emission (CFE) Gun
- Designed for low-voltage, high-resolution imaging with low aberration. Specifically, the Regulus8220/8230/8240 models achieve 0.7 nm at 1 kV, while the Regulus8100 model achieves 0.8 nm at 1 kV.
Enhanced Magnification
- Maximum magnification has been doubled from 1 million times to 2 million times, allowing for more detailed examination of specimens.
User-Support Functions
- Ensures high performance with features designed to assist users in achieving optimal results.
Additional Benefits
- Versatile Applications: The Regulus series is suitable for various fields, including materials science, nanotechnology, and biological research. Thus, it provides researchers with the tools needed to explore and analyze a wide range of specimens.
- Ease of Use: The user-friendly interface and advanced automation features make the Regulus series accessible to users of all experience levels. Consequently, this reduces the learning curve and increases productivity.
- Improved Workflow Efficiency: The advanced features and high-resolution capabilities of the Regulus series enable faster and more accurate data collection. Therefore, researchers can achieve their goals more efficiently.
Ultimately, the Hitachi Regulus Series Ultrahigh-Resolution FE-SEM provides exceptional imaging performance and user-friendly features, supporting advanced research and industrial applications.
Application
Specimen: Gold particle on Carbon
Landing voltage: 10 V
