Features:
- Highest resolution laboratory microXRF
Achieve down to single digit microns (3-5µm) with high resolution optic - Sub-ppm sensitivity
Quantify down to sub parts per million (ppm) levels with Sigray’s flexible software packages - Energy tunability
Maximize throughout and sensitivity with up to 5 different incident X-ray spectra - Large Travel and Enclosure
Enables unsupervised overnight scans. Also provides opportunity to integrate correlative techniques such as Raman Spectroscopy - Patented Multi-Target Ultrahigh Brightness X-ray Source
Sigray’s X-ray source, when combined with the X-ray opticas, has over 50X the brightness over the illumination beam (source+optics) systems employed by other leading microXRF systems. Up to 4 target materials can be customized for the AttoMap-200 source, allowing software selection optimal spectra for your sample - Achieves shallow angle imaging for thin samples (e.g., biological) and/or diffraction removal
AttoMap-310 features a goniometer to enable normal to shallow angle of incidence imaging - Light element detection
Analyse down to trace-level organics within the AttoMap’s high vacuum chamber
Energy Tunability for High Throughput and Sensitivities
Comparison of As channel in a arsenopyrite sample. Arsenic sensitivity is dramatically increased because of the substantially better As fluorescence cross-section for Mo than W.
Energy Tunability for High Throughput and Sensitivities
Select up to 5 elements for your AttoMap-310 X-ray source. Examples are given above but additional targets (e.g., Ti, Ag, etc.) may be provided upon request.
Application
- Life Sciences and Metallomics
- Environmental / Botany
- Mineralogy
- Semiconductor
- Light Element Detection
Elemental Channels of a Daphnia Water Flea
Hyperaccumulating
Mineralogical mapping using Sigray’s AttoMap (left), a correlative optical image acquired with the AttoMap (upper right), and a SEM-EDS image of the same sample.
300mm wafer in AttoMap
AttoMap-310 provides detection of elements down to B and enables trace-level (<1%) quantification of organics such as C, O, N. This is accomplished through the system’s incorporation of a specialized low energy detector and a vacuum enclosure that achieves evacuated environments of better than 10^-4 Torr. The system can also be run in ambient mode for maximum flexibility.
Low Z element detection including Boron
Linearity of Ge (2nm, 5nm, and 10nm) in a silicon wafer
