Features:
- Guaranteed indexing speeds of 400 pps
Using only 3 nA beam current - 312 x 256 pixel pattern resolution at maximum speed
4 times more pixels than a sensitive CCD detector at comparable speeds - Full megapixel resolution patterns (1244 x 1024 pixels)
Ideal for strain analyses using high resolution EBSD - High sensitivity with an optimised phosphor screen
Ensuring high quality patterns at low doses and
low beam energies – resulting in maximum spatial resolution - Low distortion optics
Ensuring an angular precision better than 0.05° - Seamless EDS integration
Even at the highest speeds - Bellows SEM interface
Maintaining the microscope’s vacuum integrity - Unique proximity sensor
Detects potential collisions before they happen and automatically moves the detector to a safe position - Simple and intuitive detector settings
Ensuring optimum results every time - Five integrated forescatter detectors
Providing full colour complementary channelling contrast and atomic number contrast images
